WBE-ASM1000LD/High and Low Temperature Key Life Testing Chamber meets the requirements of continuous pressing fatigue life testing of various buttons in high and low temperature, high temperature and high humidity, and alternating humid and hot environments, and meets the requirements of sorting and alternating striking performance testing.
High and Low Temperature Key Life Testing Chamber is a combination of a high and low temperature test chamber and a button life tester. It is used to test the performance of buttons under continuous pressing fatigue life in high and low temperature, high temperature and high humidity, and humid and hot alternating environments.
Application fields:
Various button products, including mobile phone buttons, laptop buttons, silicone rubber buttons, mice, switches, etc.
Test standards:
1.1 GB/T 2423.1 Low Temperature Test Method
1.2 GB/T 2423.2 High Temperature Test Method
1.3 GB/T 2423.34 Damp Heat Cycling Test Method
1.4 IEC 60068-2 Temperature and Humidity Test Method
1.5 GJB 150.3 High Temperature Test
1.6 GJB 150.4 Low Temperature Test
1.7 GJB 150.9 Damp Heat Test
1.8 MIL-STD-202G-103B Humidity Testt;
Product features
1. Dual-system control: The high and low temperature test chamber and the button life tester are independently controlled, resulting in more accurate test data.
2. The environmental chamber adopts a new, advanced electronic expansion valve technology and a scientific air duct design, achieving up to 45% energy savings.
3. Multi-functional pneumatic button machine with front buttons, side buttons, front multi-file buttons, and multi-sided impact buttons.
4. Programmable impact: Two cylinders can be programmed to alternately impact (the pressing and releasing time can be arbitrarily set), etc.
