Application fields:
Semiconductor chips, research institutions, quality inspection, new energy, optoelectronic communications, aerospace and military, automotive industry, LCD display, medical and other technology industries.
Test standards:
1.1, GB/T 2423.1 low temperature test method;
1.2, GB/T 2423.2 high temperature test method;
1.3, GB/T2423.34 humidity and heat cycle test method;
1.4, IEC60068-2 temperature and humidity test method;
1.5, GJB 150.3 high temperature test;
1.6, GJB 150.4 low temperature test;
1.7, GJB 150.9 Wet heat test;
1.8, MIL-STD-202G-103B humidity test;
Product features
1. Independent upper and lower chamber testing spaces with individual temperature control;
2. Effectively saves floor space, allowing simultaneous testing of different samples and improving testing efficiency;
3. Energy saving of approximately 45% (can operate continuously for over 1 year without interruption);
4. Scientifically designed air duct ensures rapid and uniform temperature and humidity stabilization;
5. Water-saving (low water consumption for humidity testing, with full water drainage to ensure clean water supply and low failure rate);
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