WBE-2SDJ Double-layer High And Low Temperature Humidity Test Chamber

WBE-2SDJ Double-layer High And Low Temperature Humidity Test Chamber

WBE-2SDJ Double-layer High And Low Temperature Humidity Test Chamber is used to test the heat resistance, cold resistance, dryness resistance, and humidity resistance of various products. It features a multi-chamber design with independent temperature control. It is primarily used in the semiconductor chip, research institutions, quality inspection, new energy, optoelectronic communications, aerospace and military, automotive, LCD display, and medical industries, among other technological sectors.

Description

Application fields:
Semiconductor chips, research institutions, quality inspection, new energy, optoelectronic communications, aerospace and military, automotive industry, LCD display, medical and other technology industries.

Test standards:

1.1, GB/T 2423.1 low temperature test method;
1.2, GB/T 2423.2 high temperature test method;
1.3, GB/T2423.34 humidity and heat cycle test method;
1.4, IEC60068-2 temperature and humidity test method;
1.5, GJB 150.3 high temperature test;
1.6, GJB 150.4 low temperature test;
1.7, GJB 150.9 Wet heat test;
1.8, MIL-STD-202G-103B humidity test;

Product features

1. Independent upper and lower chamber testing spaces with individual temperature control;

2. Effectively saves floor space, allowing simultaneous testing of different samples and improving testing efficiency;

3. Energy saving of approximately 45% (can operate continuously for over 1 year without interruption);

4. Scientifically designed air duct ensures rapid and uniform temperature and humidity stabilization;

5. Water-saving (low water consumption for humidity testing, with full water drainage to ensure clean water supply and low failure rate);