Mini High-Low Temperature Test Chamber, also known as desktop temperature and humidity test chamber, is used for reliability testing of small parts and small samples, including high temperature test, low temperature test, constant temperature and humidity test, high and low temperature alternating test, damp heat alternating (humid) test, temperature change test, environmental stress screening, etc.
WBE-SGD26L/ Mini High-Low Temperature Test Chamber: With its compact design and small footprint, it is suitable for small samples. It meets testing standards such as MIL, STD, GB, GJB, JIS, JEDEC, and IEC, and can simulate environmental conditions for reliability testing including high temperature testing, low temperature testing, constant temperature and humidity testing, high and low temperature alternating testing, damp heat alternating (humidity) testing, temperature change testing, and environmental stress screening.
Application fields:
Semiconductor chips, research institutions, quality inspection, new energy, optoelectronic communications, aerospace and military, automotive electronics, LCD/LED displays, medical and other technology industries
Test standards:
1.1, GB/T 2423.1 low temperature test method;
1.2, GB/T 2423.2 high temperature test method;
1.3, GB/T2423.34 humidity and heat cycle test method;
1.4, IEC60068-2 temperature and humidity test method;
1.5, GJB 150.3 high temperature test;
1.6, GJB 150.4 low temperature test;
1.7, GJB 150.9 Wet heat test;
1.8, MIL-STD-202G-103B humidity test;
Product features
1. Compact design with a large internal testing space, suitable for small samples;
2. Easy to move, can be placed on a table or stacked, effectively saving space;
3. Fluid simulation technology + innovative structural design, extending the equipment's lifespan by more than 1/3 compared to traditional technologies;
4. Scientific airflow design, wide temperature range, rapid temperature and humidity stabilization, and better controllability of uniformity;
